The Jeol JCM-7000 is a compact tabletop scanning electron microscope that can easily handle advanced analytical applications. The instrument complements optical microscopy through its extraordinary depth of field and high magnification. Useful properties include Real-time 3D imaging, easy-to-use metrology tools and optional fully integrated EDS for elemental analysis.
JEOL NeoScope JCM-7000 SEM
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- 41346,
- Göteborg,
- Sweden